Recent (2009-) journal papers by Professor Xie:

        

Raharjo, H.; Xie, M. and Brombacher, A.C.; On modeling dynamic priorities in the analytic hierarchy process using compositional data analysis. European Journal of Operational Research, Vol. 194, No.2, 834-846, 2009.

Li, Y.F.; Xie, M. and Goh, T.N.; A study of mutual information based feature selection for case based reasoning in software cost estimation. Expert Systems with Applications, accepted.

Shamsuzzaman, M.; Xie, M.; Goh, T.N. and Zhang, H.Y. Integrated control chart system for time-between-events monitoring in a multistage manufacturing system. Int J of Advanced Manufacturing Technology, accepted.

Li, Y.F.; Xie, M. and Goh, T.N.; A study of project selection and feature weighting for analogy based software cost estimation. Journal of Systems and Software, accepted.

Khoo, M.B.C. and Xie, M.; A study of time-between-events control chart for the monitoring of regularly maintained systems. Quality and Reliability Engineering International, accepted.

 

(2007-2008)

Hu, Q.P.; Xie, M.; Ng, S.H. and Levitin, G. Robust recurrent neural network modeling for software fault detection and correction prediction. Reliability Engineering & System Safety, Vol. 92, No.3, 332-340, 2007.

Zhang, L.F.; Xie, M. and Tang, L.C. A study of two estimation approaches for parameters of Weibull distribution based on WPP. Reliability Engineering & System Safety, Vol. 92, No. 3, 360-368, 2007.

He, Z.M.; Loh, H.T. and Xie, M. A two-dimensional probability model for evaluating reliability of piezoelectric micro-actuators. Int J of Fatigue, Vol. 29, No. 2, 245-253, 2007.

Liu, J.Y.; Xie, M.; Goh, T.N. and Chan, L.Y. A study of EWMA chart with transformed exponential data. Int J of Production Research, Vol. 45, No. 3, 743-764, 2007.

Xie, M.; Hu, Q.P.; Wu, Y.P. and Ng, S.H. A study of software fault detection and correction modeling. Quality and Reliability Engineering International, Vol. 23, No. 4, 459-470, 2007.

Levitin, G.; Xie, M. and Zhang, T.L. Reliability of fault-tolerant systems with parallel task processing. European J of Operational Research, Vol. 177, No. 1, 420-430, 2007.

Zhang, T.L. and Xie, M. Failure data analysis with extended Weibull distribution. Communications in Statistics - A: Theory and Methods, Vol.36, No.3, 579-592, 2007.

Dai, Y.S.; Xie, M., Long, Q. and Ng, S.H. Uncertainty analysis in software reliability modeling by Bayesian approach with maximum-entropy principle. IEEE Trans on Software Engineering, Vol. 33, No. 11, 781-795, 2007.

Wu, Y.P.; Hu, Q.P., Xie, M. and Ng, S.H. Modeling and analysis of software fault detection and correction, process by considering time dependency. IEEE Trans on Reliability, Vol. 56, No. 4, 629-642, 2007.

Dai, Y.S.; Xie, M. and Poh, K.L. Availability modelling and cost optimization for the grid resource management system. IEEE Trans on Systems, Man, and Cybernetics, Part A, Vol. 38, No.1, 170-179, 2008.

Lai, X.; Xie, M.; Tan, K.C. and Yang, B. Ranking of customer requirements in a competitive environment. Computers & Industrial Engineering, Vol. 54, No.2, 202-214, 2008.

Zhang, C.W.; Xie, M.; and Goh, T.N. Economic design of cumulative count of conforming charts under inspection by samples. Int J of Production Economics, Vol. 54, No.2, 202-214, 2008.

Wu, S.M. and Xie, M. Warranty cost analysis for nonrepairable services products. Int J of Systems Science , Vol.39, No.3, 279-288, 2008.

Long, Q.; Xie, M., Ng, S.H. and Levitin, G. Reliability analysis and optimization of weighted voting systems with continuous states input. European J of Operational Research, Vol. 191, No. 1, 240-252, 2008.

Jiang, H.; Xie, M. and Tang, L.C. MCMC for parameter estimation of the modified Weibull distribution. J of Applied Statistics, Vol. 35, No. 6, 647-658, 2008.

Raharjo, H.; Brombacher, A.C. and Xie, M. Dealing with subjectivity in early product design phase. Computers & Industrial Engineering, Vol. 55, No. 1, 253-278, 2008.
 


Some earlier journal papers (first author except those marked with *):
  • On some importance measures of system components. Stochastic Processes and their Applications, Vol.25, No.2, 273-280, 1987.
  • A shock model for software failures. Microelectronics and Reliability,  Vol.27, No.4, 717-724, 1987.
  • A note on the Natvig measure. Scandinavian J of Statistics, Vol.5, No.3, 221-224, 1988.
  • Some results on renewal-type equations. Communications in Statistics -  A:  Theory and Methods, Vol.18, No.3, 1159-1171, 1989.
  • On the solution of renewal-type integral equations. Communications in Statistics - B: Computation & Simulation, Vol.18, No.1, 291-293, 1989.
  • *The increase of reliability of k-out-of-n systems through improving a component. (with K. Shen) Reliability Engineering and System Safety, Vol.26, No.2, 189-195, 1989.
  • Some Total Time on Test quantities useful for testing constant against Bathtub-shaped Failure Rate distributions. Scandinavian J of Statistics, Vol.16, No.2, 137-144, 1989.
  • On a Markov model for software reliability analysis. Applied Stochastic Models and Data Analysis, Vol.6, No.4, 207-213, 1990.
  • On the increase of system reliability due to some improvement at component level. (with K. Shen) Reliability Engineering and System Safety, Vol.28, No.1, 111-120, 1990.
  • *On the increase of system reliability by parallel redundancy. (with K. Shen) IEEE Trans on Reliability, Vol.R-39, No.5, 607-611, 1990.
  • On a general importance measure of component importance. (with B. Bergman) J of Statistical Planning and Inference, Vol.29, No.1, 211-220, 1991.
  • Some new aspects of stress-strength modelling. (with K. Shen) Reliability Engineering and System Safety, Vol.33, No.1, 131-140, 1991.
  • *The effectiveness of adding standby redundancy at system and component levels. (with K. Shen) IEEE Trans on Reliability, Vol.R-40, No.1, 53-55, 1991.
  • Some procedures for decision making in controlling high yield processes. (with T.N.Goh) Quality and Reliability Engineering International, Vol.8, No.4, 355-360, 1992.
  • On some reliability growth models with graphical interpretations. (with M. Zhao) Microelectronics and Reliability, Vol.33, No.2, 149-167, 1993.
  • Improvement detection by control charts for high yield processes. (with T.N. Goh) Int J of Quality and Reliability Management, Vol.10, No.7, 24-31, 1993.
  • SPC of a near-zero defect process subject to random shocks. (with T.N. Goh) Quality and Reliability Engineering International, Vol.9, No.2, 89-93, 1993.
  • *New approach to quality in a near zero defect environment. (with T.N. Goh) Total Quality Management, Vol.5, No.3, 3-10, 1994.
  • *A study of a storage reliability estimation problem. (with M. Zhao and Y.T. Zhang) Quality and Reliability Engineering International, Vol.11, No.2, 123-127, 1995.
  • *Control charts for processes subject to random shocks. (with W. Xie and T.N. Goh) Quality and Reliability Engineering International, Vol.11, No.5, 355-360, 1995.
  • Reliability analysis using an additive Weibull model with bathtub-shaped failure rate function. (with C.D. Lai) Reliability Engineering and System Safety, Vol.52, No.1, 87-94, 1996.
  • Exploiting symmetry in the reliability analysis of coherent systems. (with C.D. Lai) Naval Research Logistics, Vol.43, No.7, 1025-1034, 1996.
  • On the increase of the expected lifetime by parallel redundancy. (with C.D. Lai) Asia-Pacific J of Operational Research, Vol.13, No.2, 171-179, 1996.
  • On process control based on Geometric distribution. (with T.N. Goh) Int J of Quality and Reliability Management, Vol.14, No.1, 64-73, 1997.
  • A study of economic design of control charts for cumulative count of conforming items. (with T.N. Goh and W. Xie) Communications in Statistics - B: Simulation and Computation, Vol.26, No.3, 1009-1027, 1997.
  • On reliability bounds via conditional inequalities. (with C.D. Lai), J of Applied Probability, Vol.35, No.1, 104-114, 1998.
  • *Prioritising processes in initial implementation of statistical process control. (with T.N. Goh and W. Xie), IEEE Trans on Engineering Management, Vol.45, No.1, 247-353, 1998.
  • A study of the sensitivity of software release time. (with G.Y. Hong), J of Systems and Software, Vol.44, No.2, 163-168, 1998.
  • A procedure for monitoring high quality processes with correlated measurement. (with X.S. Lu et al.) Int J of Reliability, Quality and Safety Engineering, Vol.5, No.2, 147-156, 1998.
  • *A control chart for multivariate attribute processes. (with X.S. Lu et al.) Int J of Production Research, Vol.36, No.12, 3477-3489, 1998.
  • A sensitivity study of the sensitivity of "Customer Voice" in QFD analysis. (with H. Wang and T.N. Goh) Int J of Industrial Eng - Applications and Practices, Vol.5, No.4, 301-307, 1998.
  • Quality dimensions of internet search engines. (with T.N. Goh and H. Wang) J of Information Sciences, Vol.24, No.5, 365-372, 1998.
  • *A comparison between software design and code metrics for the prediction of software fault content. (with M. Zhao et al.) Information and Software Technology, Vol. 40, No.14, 801-809, 1998.
  • *Service quality of internet search engines. (with T.N. Goh and H. Wang) J of Information Sciences, Vol.25, No.6, 499-507, 1999.
  • *Sensitivity of the relationship matrix in quality function deployment. (with X.X. Shen et al.) Int J of Industrial Engineering, Vol.6, No.3, 214-223, 1999.
  • Software reliability prediction incorporating information from a similar project. (with G.Y. Hong and C. Wohlin) J of Systems and Software, Vol.49, No.1, 43-48, 1999.
  • A quality monitoring and decision making scheme for automated production processes. (with X.S. Lu et al.) Int J of Quality and Reliability Management, Vol.16, No.2, 148-157, 1999.
  • *A study of operational and testing reliability in software reliability analysis. (with B. Yang) Reliability Engineering and System Safety, Vol.70, No.2, 323-329, 2000.
  • Data transformation for geometrically distributed quality characteristics. with T.N. Goh and X.Y. Tang) Quality and Reliability Engineering International, Vol.16, No.1, 9-15, 2000.
  • *A cumulative quantity control chart for manufacturing processes. (with P.L.Y. Chan and T.N. Goh) Int J of Production Research, Vol.38, No.2, 397-408, 2000.
  • *A new family of positive quadrant dependent bivariate distributions. (with C.D. Lai) Statistics and Probability Letters, Vol.46, No.4, 359-364, 2000.
  • Fault tree analysis for optimisation and planning. (with K.H. Goh et al.) Int J of Quality and Reliability Management, Vol.17, No.2, 189-199, 2000.
  • *Study of a Markov model for high quality dependent process. (with C.D. Lai and K. Govindaraju) J of Applied Statistics, Vol.27. No.4, 461-473, 2000.
  • Zero-Inflated Poisson model in statistical process control. (with T.N. Goh and B. He) Computational Statistics and Data Analysis, Vol. 38, No.2, 191-201, 2001. 
  • *A study of lifetime distributions for regularly replaced systems. (with H. Kong and T.N. Goh) Asia-Pacific J of Operational Research, Vol.18, No.1, 67-76, 2001. 
  • On the monitoring of trended and regularly adjusted processes. (with E. Del Castillo et al.) Int J of Production Research, Vol.39, No.16, 3641-3650, 2001. 
  • *Availability analysis of periodically inspected systems with random walk model. (with L.R. Cui) J of Applied Probability, Vol.38, No.4, 860-871, 2001. 
  • A modified Weibull extension with bathtub-shaped failure rate function. (with Y. Tang and T.N. Goh) Reliability Engineering and System Safety, Vol.76, No.2, 279-285, 2002. 
  • *A conditional decision procedure for high-yield processes. (with Kuralami et al.) IIE Transactions, Vol.34, No.12, 1021-1030, 2002. 
  • Process capability indices for regularly adjusted process. (with K.L. Tsui et al.) Int J of Production Research, Vol.40, No.10, 2367-2378, 2002. 
  • *On the performance of geometric chart with estimated control limits. (with Z. Yang et al.) J of Quality Technology, Vol.34, No.4, 448-458, 2002. 
  • Some effective control chart procedures for reliability monitoring. (with P. Ranjan et al.) Reliability Engineering and System Safety, Vol.77, No.2, 143-150, 2002. 
  • *Economic design for trended processes. (with D.Q. Cai et al.) Int J of Production Economics, Vol.79, No.1, 85-92, 2002. 
  • Optimal control limits for CCC charts in the presence of inspection errors. (with P. Ranjan et al.) Quality and Reliability Engineering International,  Vol.19, No.2, 149-160, 2003. 
  • Error analysis of some integration procedures for renewal equation and convolution Integrals. (with Preuss et al.) J of Statistical Computation and Simulation, Vol.73, No.1, 59-70 , 2003. 
  • *A modified Weibull distribution. (with C.D. Lai and D.N.P. Murthy) IEEE Trans on Reliability, Vol.52, No.1, 33-37, 2003. 
  • Study of the effect of imperfect debugging on software development cost. (with B. Yang) IEEE Trans on Software Engineering, Vol.29, No.5, 471-473, 2003. 
  • On the effect of redundancy for systems with dependent components. (with S. Kotz and C.D. Lai) IIE Transactions, Vol.35, No.12, 1103-1110, 2003. 
  • *Inspection schemes for general systems. (with L.R. Cui and H.T. Loh) IIE Transactions, Vol.36, No.9, 817-825, 2004. 
  • On changing points of mean residual life and failure rate function for some generalized Weibull distributions. (with T.N. Goh and Y. Tang) Reliability Engineering and System Safety, Vol.84, No.3, 293-299, 2004. 
  • Distributed system availability in the case of imperfect debugging process. (with Y.S. Dai et al.) Int J of Industrial Engineering, Vol.11, No.4, 396-405, 2004.
  • *Sequential inspection strategy for multiple systems under availability requirement. (with L.R. Cui and H.T. Loh) European J of Operational Research, Vol.155, No.1, 170-177, 2004. 
  • *A model for correlated failures in N-version programming. (with Y.S. Dai et al.) IIE Transactions, Vol.36, No.12, 1183-1192, 2004. 
  • Optimal number of hosts in distributed systems based on cost criteria. (with Y.S. Dai et al.) Int J of Systems Science, Vol.35, No.6, 343-353, 2004. 
  • *Availability of a periodically inspected system with random repair or replacement times. (with L.R. Cui) J of Statistical Planning and Inference, Vol.131, No.1, 89-100, 2005. 
  • *Software failure prediction based on a Markov Bayesian network model. (with C.G. Bai et al.) J of Systems and Software, Vol.74, No.3, 275-282, 2005. 
  • *Modeling and analysis of correlated software failures of multiple types. (with Y.S. Dai and K.L. Poh) IEEE Trans on Reliability, Vol.54, No.1, 100-106, 2005.
  • *A general Weibull model for reliability analysis under different failure criteria. (with J. Liu et al.) IEEE Trans on Electronics Packaging and Manufacturing, Vol.28, No.4, 322-327, 2005.
  • *Dynamic Programming for QFD Optimization. (with X. Lai and K.C. Tan) Quality and Reliability Engineering International, Vol.21, No.8, 769-780, 2005.
  • *Reliability of grid service systems. (with Y.S. Dai and K.L. Poh) Computers & Industrial Engineering, Vol.50, No.1, 130-147, 2005.
  • *Bias correction for the least squares estimator of Weibull shape parameter with complete and censored data. (with L.F. Zhang and L.C. Tang) Reliability Engineering and System Safety, Vol.91, No.8, 930-939, 2006.
  • *On Control Charts Based on the Generalized. (with B. He et al.) Quality Technology and Quantitative Management, Vol.38, No.6, 499-509, 2006.
  • *Performance distribution of a fault tolerant system in the presence of failure correlation. (with G. Levitin) IIE Transactions, Vol.3, No.4, 383-400, 2006.
  • *Prioritising quality characteristics in dynamic quality. (with H. Raharjo and A.C. Brombacher) Int J of Production Research, Vol.44, No.23, 5005-5018.
  • *Cumulative count of conforming chart with variable sampling intervals. (with J.Y. Liu et al.) Int J of Production Economics, Vol.101, No.2, 286-297, 2006.
  • *Design of exponential control charts using a sequential sampling scheme. (with C.W. Zhang and T.N. Goh) IIE Transactions, Vol.101, No.12, 1105-1116-297, 2006.