My Books 
       
Books authored/co-authored by Prof Xie:


Lai, C.D. and Xie, M. (2006). Stochastic Ageing and Dependence for Reliability, Springer, New York, USA; 

This book summarizes various concepts and results related to system ageing and dependence, an area of research I started to work on since I was a graduate student.

Xie, M.; Dai, Y.S. and Poh, K.L. (2004). Computing Systems Reliability: Models and Analysis, Kluwer Academic/Plenum Publishers, Boston, MA, USA; 

Probability models for reliability analysis of software, hardware, distributed computing, Grid computing multi-state systems, are summarized.


Murthy, D.N.P.; Xie, M. and Jiang, R. (2003). Weibull Models, John Wiley & Sons, New York, USA. 

Almost all models related to Weibull distribution that is very useful in reliability and survival analysis are described in this book.


Xie, M.; Tan, K.C. and Goh, T.N. (2003). Advanced QFD Applications, ASQ Quality Press, Milwaukee, WI, USA; 

Various methods using Quality Function Deployment technique for quality improvement and analysis are described with the emphasis on some more advanced methods.


Xie, M.; Goh, T.N. and Kuralmani, V. (2002). Statistical Models and Control Charts for High Quality Processes, Kluwer Academic Publisher, Boston, MA, USA; 

Several statistical models and techniques for the monitoring and control of high quality processes are presented in this book based on our recent research.


Xu, R.Z.; Xie, M. and Zheng, R.J. (1994). Software Reliability Models and Applications, (in Chinese) Tsinghua University Press, Beijing, China;
 

Xie, M. (1991). Software Reliability Modelling, World Scientific Publisher, Singapore;

Now a classic book that summarizes most of the models for software reliability analysis.

 


 

Edited volumes:

 

Chai, K.H., Hang, C.C. and Xie, M. (2006). Proceedings of the 2006 IEEE International Conference on Management of Engineering and Technology, 21-23 June, 2006, Singapore; 
I served as the organizing committee chair of this conference, and helped editing the 2-volume proceedings of about 250 full papers. ISBN: 1-4244-0148-8.

Cui, L.R., Tsang, A.H.C. and Xie, M., (2005). Proceedings of the Fourth International Conference on Quality and Reliability, 9-11 August, 2005, Beijing, China; 

This is a 991-page conference proceedings, with 125 full papers. Published by Beijing Institute of Technology Press, ISBN: 7-81045-742-X.
 

Xie, M., Tang, H.K. and Duranni, T. (2004). Proceedings of the 2004 IEEE International Engineering Management Conference, 18-21 October, 2004, Singapore; 
I served as the main editor of this 3-volume conference proceedings, and the conference was attended by 400 participants with almost 300 papers presented. Published by IEEE Press, ISBN: 0-7803-8519-5.
 

Hayakawa, Y.; Irony, T. and Xie, M. (2001). System and Bayesian Reliability - Essays in honor Professor Richard E Barlow on His 70th Birthday, (ed) World Scientific Publisher, Singapore; 
I initiated this while on sabbatical leave at University of California at Berkeley in 2000. The volume consists of 23 refereed articles by leading researchers in the field.
 

Xie, M. and Murthy, D.N.P. (1998). Proceedings of the International Workshop on Reliability Modelling and Analysis - From Theory to Practice, 3 November 1998, Singapore; 
This proceedings consists of 20 full papers presented by researchers from Asia, Europe and North America in a one-day event.